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Physical Review B

Volumn 44, Issue 4, 1991, Pages 1600-1612

Inhomogeneities in plastically deformed silicon single crystals. II. Deep-level transient spectroscopy investigations of p- and n-doped silicon

(2) Kisielowski, C a Weber, E R a

a UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 35949014979 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.44.1600 Document Type: Article

Times cited : (59)

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