SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Physical Review B

Volumn 44, Issue 20, 1991, Pages 11402-11411

Electron-energy-loss-spectroscopy near-edge fine structures in the iron-oxygen system

(3) Colliex, C a,b Manoubi, T b Ortiz, C a

a IBM ALMADEN RESEARCH CENTER (United States)

b UNIVERSITÉ PARIS SUD (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 35949012815 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.44.11402 Document Type: Article

Times cited : (346)

References (49)

1
- 0348073973
- (1977) Surf. Sci. , vol.68 , pp. 459
- Brundle, C.R.¹ Chuang, T.J.² Wendelt, K.³

2
- 84927906370
- (1986) Appl. Phys. Lett. , vol.49 , pp. 824
- Aescklimarin, M.¹ Bona, G.L.² Meier, F.³ Stampanoni, M.⁴ Zampien, G.⁵ Siegman, H.C.⁶

3
- 0000190935
- (1988) J. Mater. Res. , vol.3 , pp. 344
- Ortiz, C.¹ Lim, G.² Chen, M.M.³ Castillo, G.⁴

4
- 0025413954
- (1990) J. Mater. Res. , vol.5 , pp. 824
- Ortiz, C.¹ Hwang, C.² Morrish, A.H.³ Zhou, X.Z.⁴

5
- 0022186374
- (1985) Ultramicroscopy , vol.18 , pp. 155
- Krivanek, O.L.¹ Manoubi, T.² Colliex, C.³

6
- 2842515744
- (1961) Phys. Rev. , vol.124 , pp. 1866
- Fano, U.¹

7
- 4043080473
- (1974) Phys. Rev. Lett. , vol.33 , pp. 1372
- Dietz, R.E.¹ MacRae, E.G.² Yafet, Y.³ Caldwell, C.W.⁴

8
- 84927909056
- edited by, A. Bianconi, L. Incoccia, S. Stipeich, Springer Series in Chemical Physics Vol. 27, Springer-Verlag, Berlin
- (1983) EXAFS and Near Edge Structure , pp. 29
- Wendin, G.¹

9
- 0014832197
- Molecular-Orbital Interpretation of the Soft X-Ray LII,III Emission and Absorption Spectra from Some Titanium and Vanadium Compounds
- (1970) Journal of Applied Physics , vol.41 , pp. 3561
- Fischer, D.W.¹

10
- 0000257290
- (1983) Phys. Rev. B , vol.27 , pp. 2111
- Grunes, L.A.¹

11
- 0004274846
- Plenum, New York
- (1986) EELS in the Electron Microscope
- Egerton, R.F.¹

12
- 0023839544
- (1988) Ultramicroscopy , vol.24 , pp. 399
- Trebbia, P.¹

13
- 0002916430
- Curve fitting methods for quantitative analysis in electron energy loss spectroscopy
- (1990) Microscopy Microanalysis Microstructures , vol.1 , pp. 23
- Manoubi, T.¹ Walls, M.² Tencé, M.³ Colliex, C.⁴

14
- 0018399188
- (1979) Ultramicroscopy , vol.4 , pp. 169
- Egerton, R.F.¹

15
- 84927885653
- (1982) Ultramicroscopy , vol.9 , pp. 293
- Rez, P.¹

16
- 0024641549
- (1989) Ultramicroscopy , vol.28 , pp. 16
- Rez, P.¹

17
- 0001525733
- (1982) Phys. Rev. B , vol.25 , pp. 7157
- Grunes, L.A.¹ Leapman, R.D.² Wilker, C.N.³ Hoffmann, R.⁴ Kunz, A.B.⁵

18
- 0025424639
- (1990) Ultramicroscopy , vol.32 , pp. 319
- Paterson, J.H.¹ Krivanek, O.L.²

19
- 0000346803
- (1987) Phys. Rev. B , vol.36 , pp. 9241
- Nakai, S.¹ Mitsuishi, T.² Sugarawa, H.³ Maezawa, H.⁴ Matsukawa, T.⁵ Mitani, S.⁶ Yamasaki, K.⁷ Fujikawa, T.⁸

20
- 33646642931
- (1989) Phys. Rev. B , vol.40 , pp. 5715
- de Groot, F.M.¹ Grioni, M.² Fuggle, J.C.³ Ghijsen, J.⁴ Sawatzky, G.A.⁵ Petersen, H.⁶

21
- 0024640235
- (1989) Ultramicroscopy , vol.28 , pp. 49
- Manoubi, T.¹ Tencé, M.² Colliex, C.³

22
- 0012273392
- (1966) Ann. Phys. (Paris) , vol.1 , pp. 439
- Bonnelle, C.¹

23
- 4244047487
- (1988) Phys. Rev. B , vol.38 , pp. 3158
- Thole, B.T.¹ Van der Laan, G.²

24
- 0000412865
- (1980) Phys. Rev. Lett. , vol.45 , pp. 397
- Leapman, R.D.¹ Grunes, L.A.²

25
- 0001722887
- (1982) Phys. Rev. B , vol.26 , pp. 614
- Leapman, R.D.¹ Grunes, L.A.² Fejes, P.L.³

26
- 35949025871
- Site-Specific Valence Determination by Electron Energy-Loss Spectroscopy
- (1982) Physical Review Letters , vol.48 , pp. 560
- Tafto, J.¹ Krivanek, O.L.²

27
- 0022223065
- (1985) Ultramicroscopy , vol.18 , pp. 285
- Otten, M.T.¹ Miner, B.² Rask, J.H.³ Buseck, P.R.⁴

28
- 0001114737
- (1984) Chem. Phys. Lett. , vol.108 , pp. 547
- Sparrow, T.G.¹ Williams, B.G.² Rao, C.N.³ Thomas, J.M.⁴

29
- 0000320041
- (1985) Phys. Rev. B , vol.32 , pp. 4899
- Fink, J.¹ Müller-Heinzerling, T.² Scheerer, B.³ Speier, W.⁴ Hillebrecht, F.U.⁵ Fuggle, J.C.⁶ Zaanen, J.⁷ Sawatzky, G.A.⁸

30
- 0025427138
- (1990) Ultramicroscopy , vol.32 , pp. 309
- Krishnan, K.M.¹

31
- 0025423773
- (1990) Ultramicroscopy , vol.32 , pp. 313
- Krivanek, O.L.¹ Paterson, J.H.²

32
- 0344914102
- (1986) J. Electron Microsc. , vol.35 , pp. 307
- Colliex, C.¹ Manoubi, T.² Krivanek, O.L.³

33
- 0000642185
- (1974) Am. Mineral. , vol.59 , pp. 319
- Tossell, J.A.¹ Vaughan, D.J.² Johnson, K.H.³

34
- 0003593326
- Academic, New York
- (1970) Multiplets of Transition Metal Ions in Crystals
- Sugano, S.¹ Tanabe, Y.² Kamimura, H.³

35
- 0000277698
- (1988) Phys. Rev. B , vol.37 , pp. 1550
- Lytle, F.W.¹ Greegor, R.B.² Panson, A.J.³

36
- 0019553094
- (1981) Solid State Commun. , vol.38 , pp. 159
- Durham, J.P.¹ Pendry, J.B.² Hodges, C.H.³

37
- 0002836165
- (1986) Phys. Rev. B , vol.33 , pp. 22
- Lindner, T.¹ Sauer, H.² Engel, W.³ Kambe, K.⁴

38
- 0001137101
- (1989) Phys. Rev. B , vol.39 , pp. 7405
- Weng, X.D.¹ Rez, P.²

39
- 4244043516
- (1984) Phys. Rev. Lett. , vol.53 , pp. 1684
- Stöhr, J.¹ Sette, F.² Johnson, A.L.³

40
- 0006219485
- (1984) Phys. Rev. Lett. , vol.52 , pp. 1990
- Bunker, G.¹ Stern, E.A.²

41
- 84927817243
- T. Manoubi, Ph.D. dissertation, Oray, 1989.

42
- 36149044186
- (1982) J. Phys. C , vol.15 , pp. 2641
- Yamaguchi, T.¹ Shibuya, S.² Suga, S.³ Shin, S.⁴

43
- 0022128742
- (1985) J. Phys. Soc. Jpn. , vol.54 , pp. 3591
- Ohno, Y.¹ Nakai, S.²

44
- 0001690043
- (1986) Phys. Rev. B , vol.34 , pp. 1467
- Waddington, W.G.¹ Rez, P.² Grant, I.P.³ Humphreys, C.J.⁴

45
- 0000342512
- (1985) Phys. Rev. B , vol.32 , pp. 4905
- Zaanen, J.¹ Sawatzky, G.A.² Fink, J.³ Speier, W.⁴

46
- 0001387387
- (1990) Phys. Rev. B , vol.41 , pp. 928
- de Groot, F.M.¹ Fuggle, J.C.² Thole, B.T.³ Sawatzky, G.A.⁴

47
- 0001333043
- (1987) Phys. Rev. B , vol.32 , pp. 3107
- Morrison, T.I.¹ Brodsky, M.B.² Zaluzec, N.J.³ Sill, L.R.⁴

48
- 0008063193
- (1986) Phys. Lett. , vol.114 A , pp. 491
- Pease, D.M.¹ Bader, S.D.² Brodsky, M.B.³ Budnick, J.I.⁴ Morrisson, T.I.⁵ Zaluzec, N.J.⁶

49
- 0004379301
- (1987) Phys. Rev. B , vol.36 , pp. 3739
- Morrison, T.I.¹ Foiles, C.L.² Pease, D.M.³ Zaluzec, N.J.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.