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Physical Review B

Volumn 47, Issue 1, 1993, Pages 400-417

Electromigration study of oxygen disorder and grain-boundary effects in YBa2Cu3O7- thin films

(3) Moeckly, B H a Lathrop, D K a Buhrman, R A a

a Department of Population Medicine and Diagnostic Sciences (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 35949005960 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.47.400 Document Type: Article

Times cited : (209)

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