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Volumn , Issue , 2006, Pages

A direction dependent parametric model for the vacuum adhesion system of the alicia II robot

Author keywords

Adhesion control; Climbing robot; Direction dependent systems; Non linear parametric model

Indexed keywords

CLIMBING ROBOT ALICIA II; CONTROL ALGORITHM; NON-LINEAR PARAMETRIC MODEL; VACUUM ADHESION SYSTEM;

EID: 35948995026     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MED.2006.328872     Document Type: Conference Paper
Times cited : (7)

References (7)
  • 2
    • 35948978384 scopus 로고    scopus 로고
    • Proceedings of the Third International Conference on Climbing and Walking Robots CLAWAR 2000, Madrid (Spain), 2-4 October 2000, Professional Engineering Publishing.
    • Proceedings of the Third International Conference on Climbing and Walking Robots CLAWAR 2000, Madrid (Spain), 2-4 October 2000, Professional Engineering Publishing.
  • 4
    • 33644687175 scopus 로고    scopus 로고
    • The Alicia3 Climbing Robot for Automatic Wall Inspection
    • to appear, March
    • D. Longo and G. Muscato, "The Alicia3 Climbing Robot for Automatic Wall Inspection," IEEE Robotics and Automation Magazine, to appear, March 2006.
    • (2006) IEEE Robotics and Automation Magazine
    • Longo, D.1    Muscato, G.2
  • 6
    • 0035467320 scopus 로고    scopus 로고
    • Identification of processes with direction- dependent dynamics
    • September
    • A.H. Tan and K.R. Godfrey, "Identification of processes with direction- dependent dynamics", IEE Proc.-Control Theory Appl.,Vol. 148, No. 5, September 2001.
    • (2001) IEE Proc.-Control Theory Appl , vol.148 , Issue.5
    • Tan, A.H.1    Godfrey, K.R.2
  • 7
    • 0036054087 scopus 로고    scopus 로고
    • Modelling of direction-dependent dynamic processes: A comparison of Wiener models and neural networks
    • Anchorage, AK, USA, 21-23 May
    • A. H. Tan and K.R. Godfrey, "Modelling of direction-dependent dynamic processes: a comparison of Wiener models and neural networks", IEEE Instrumentation and Measurement Technology Conference, Anchorage, AK, USA, 21-23 May 2002, pp. 215-220.
    • (2002) IEEE Instrumentation and Measurement Technology Conference , pp. 215-220
    • Tan, A.H.1    Godfrey, K.R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.