Quality of information trade-offs in the detection of transient phenomena

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6562, Issue , 2007, Pages

  Bisdikian, Chatschik ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAYESIAN NETWORKS; DATA REDUCTION; SENSORS; TARGET TRACKING;

DATA RELIABILITY; QUALITY OF INFORMATION; TIMELINESS; TRANSIENT PHENOMENA;

DATA PROCESSING;

EID: 35948985605     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.724744     Document Type: Conference Paper

References (9)

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