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Volumn 132, Issue 5, 2004, Pages
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Probing technology moves ahead
a
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Author keywords
[No Author keywords available]
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Indexed keywords
DIMENSIONAL MEASUREMENT;
METROLOGY INDUSTRY;
PART CHECKING;
SCANNING PROBE TECHNOLOGY;
COST REDUCTION;
FITS AND TOLERANCES;
INSPECTION;
MACHINING;
PRECISION ENGINEERING;
ROBUST CONTROL;
SCANNING;
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EID: 35948965674
PISSN: 03610853
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (4)
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References (0)
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