Electric field enhancement between two Si microdisks

Optics Express

Volumn 15, Issue 22, 2007, Pages 14711-14716

  Sigalas, M M ^a   Fattal, D A ^a   Williams, R S ^a   Wang, S Y ^a   Beausoleil, R G ^a  

^a HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC FIELD EFFECTS; NANOPARTICLES; TIME DOMAIN ANALYSIS;

FIELD ENHANCEMENT; MICRODISKS;

SILICON;

EID: 35948954838     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.014711     Document Type: Article

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