Proposal of X-ray fluorescence analysis for solid-liquid interfaces and monitoring chemical plating processes

Bunseki Kagaku

Volumn 56, Issue 6, 2007, Pages 499-504

  Tsutsumimoto, Kaoru ^a   Tsuji, Kouichi ^a,b  

^a Osaka City University   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Interface analysis; Liquid sample; Ni plating; Time resolved XRF; Uniting form X ray pipe

Indexed keywords

EID: 35948938647     PISSN: 05251931     EISSN: None     Source Type: Journal    
DOI: 10.2116/bunsekikagaku.56.499     Document Type: Article

References (6)

1. Japanese source
2. Japanese source
3. K. Tsuji, K. Tsutsumimoto, K. Nakano, K. Tanaka, A. Okhrimovskyy, Y. Konishi, X. Ding: Adv. X-ray Anal., 49, 296 (2006).
4. Japanese source
5. (Bunseki Kagaku), 55, 427 (2006).
6. K. Tsuji, K. Nakano, X. Ding: Spectrochim. Acta B, in press.