Assimilating remotely sensed LAI into GIS-based EPIC model for yield assessment on regional scale

Nongye Gongcheng Xuebao/Transactions of the Chinese Society of Agricultural Engineering

Volumn 23, Issue 9, 2007, Pages 130-136

  Yang, Peng ^a,b,c   Wu, Wenbin ^a,b,c   Zhou, Qingbo ^a,b   Chen, Zhongxin ^a,b   Zha, Yan ^b   Tang, Huajun ^a,b   Ryosuke, Shibasaki ^c  

^a AGRO ENVIRONMENTAL PROTECTION INSTITUTE   (China)

^b INSTITUTE OF PLANT PROTECTION   (China)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

Crop growth model; Crop yield assessment; Data assimilation; LAI (leaf area index); Remote sensing; Vegetation index; Winter wheat

Indexed keywords

EID: 35748977603     PISSN: 10026819     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (29)