EDS assisted phase differentiation in orientation imaging microscopy

Materials Science Forum

Volumn 509, Issue , 2006, Pages 11-16

  Wright, Stuart I ^a   Nowell, Matthew M ^a  

^a EDAX TSL   (United States)

Author keywords

EBSD; EDS; Electron backscatter diffraction; OIM; Orientation imaging microscopy; Phase differentiation; X ray energy dispersive spectroscopy

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION; ENERGY DISPERSIVE SPECTROSCOPY; POLYCRYSTALLINE MATERIALS;

AUTOMATED ELECTRON BACKSCATTER DIFFRACTION (EBSD); CRYSTALLOGRAPHIC STRUCTURE; MULTIPHASE MATERIALS; ORIENTATION IMAGING MICROSCOPY (OIM); PHASE DIFFERENTIATION; X-RAY ENERGY DISPERSIVE SPECTROSCOPY;

TEXTURES;

EID: 35748973913     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-993-8.11     Document Type: Conference Paper

References (7)

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4. S.I. Wright and M.M. Nowell: submitted to Ultramicroscopy (2003).
5. D.P. Field: Ultramicroscopy Vol. 67 (1997), p. 1.
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7. K. Kunze, S.I. Wright, B.L. Adams and D.J. Dingley: Textures and Microstructures Vol. 20 (1993), p. 41.