Effect of frit content in Ag paste and thickness of transparent dielectric on yellowing phenomenon

Materials Science Forum

Volumn 510-511, Issue , 2006, Pages 506-509

  Jeon, Jae Sam ^a   Cha, Myung Ryoung ^a   Kim, Nam Sok ^a   Kim, Hyung Sun ^a  

^a Inha University   (South Korea)

Author keywords

Ag electrode; Bismuth glass; Transparent dielectric; Yellowing phenomenon

Indexed keywords

BISMUTH; ELECTRODES; GLASS; SILVER; TRANSPARENCY;

AG ELECTRODES; BISMUTH GLASS; TRANSPARENT DIELECTRICS; YELLOWING PHENOMENON;

DIELECTRIC MATERIALS;

EID: 35748948082     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-995-4.506     Document Type: Conference Paper

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