Microwave focusing and beam collimation using negative index of refraction lenses

IET Microwaves, Antennas and Propagation

Volumn 1, Issue 1, 2007, Pages 108-115

  Greegor, R B ^a   Parazzoli, C G ^a   Nielsen, J A ^a   Thompson, M A ^a   Tanielian, M H ^a   Vier, D C ^b   Schultz, S ^b   Smith, D R ^c   Schurig, D ^c  

^a BOEING COMPANY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c DUKE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

3D LENS; BEAM COLLIMATING; BEAM COLLIMATION; FOCUSING PROPERTIES; GRADIENT INDEXES; INDEX OF REFRACTION; NEGATIVE INDEX MATERIAL; NEGATIVE INDEX OF REFRACTION; NEGATIVE INDEX OF REFRACTION MATERIALS; REFRACTION ANGLES; SNELL'S LAW;

ELECTRON OPTICS; FOCUSING; MICROWAVE DEVICES; PRINTED CIRCUIT BOARDS; REFRACTIVE INDEX;

REFRACTION;

EID: 35649028781     PISSN: 17518725     EISSN: 17518733     Source Type: Journal    
DOI: 10.1049/iet-map:20060071     Document Type: Article

References (9)

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