Simulating correlated marked-point processes

Journal of Applied Statistics

Volumn 34, Issue 9, 2007, Pages 1125-1134

  Xu, C ^a   Dowd, P A ^a   Mardia, K V ^b   Fowell, R J ^b   Taylor, C C ^b  

^a UNIVERSITY OF ADELAIDE   (Australia)

^b UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

Marked point process; Point process simulation; Simulated annealing; Spatial mark correlation

Indexed keywords

EID: 35648955533     PISSN: 02664763     EISSN: 13600532     Source Type: Journal    
DOI: 10.1080/02664760701597231     Document Type: Article

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