Growth and characterization of Y2O3:Eu on Si and yttria-stabilized zirconia

Journal of Applied Physics

Volumn 90, Issue 12, 2001, Pages 6110-

  Rhee, Seuk Joo ^a   White, Jeffrey O ^a   Lee, Sangwoo ^a   Chen, Haydn ^a  

^a University of Illinois at Urbana Champaign   (United States)

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Indexed keywords

EID: 35549013943     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1415069     Document Type: Article

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