Quantitative determination of magnetic fields on object surfaces via photoemission electron microscopy without restriction of the electron beam

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 264, Issue 1, 2007, Pages 194-200

  Nepijko, S A ^a,b   Marx, G K L ^a   Schonhense G ^a  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b INSTITUTE OF PHYSICS   (Ukraine)

Author keywords

Photoemission electron microscopy; Stray fields

Indexed keywords

ELECTRON BEAMS; ELECTRON MICROSCOPY;

CONTRAST APERTURE; PHOTOEMISSION ELECTRON MICROSCOPY; STRAY FIELDS;

MAGNETIC FIELD MEASUREMENT;

EID: 35548963382     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.08.076     Document Type: Article

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