Off-track margin in bit patterned media

Applied Physics Letters

Volumn 91, Issue 16, 2007, Pages

  Moser, Andreas ^a   Hellwig, Olav ^a   Kercher, Dan ^a   Dobisz, Elisabeth ^a  

^a HITACHI AMERICA LTD   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; IMAGE ANALYSIS;

BIT PATTERNED MEDIA; HARD ERROR RATES; OFF TRACK MARGINS; RECORDING SYSTEMS; STATIC WRITE TESTERS;

PATTERN RECOGNITION;

EID: 35548954181     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2799174     Document Type: Article

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