|
Volumn 22, Issue 23, 2007, Pages 4158-4178
|
Experimental testing of dynamically optimized photoelectron beams
a a a a c b b b b b b b b b d b |
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 35449000579
PISSN: 0217751X
EISSN: None
Source Type: Journal
DOI: 10.1142/S0217751X0703772X Document Type: Article |
Times cited : (2)
|
References (11)
|