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Volumn 22, Issue 11, 2007, Pages 1415-1419
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A new method to eliminate the influence of in situ contamination in SIMS analysis of hydrogen
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Author keywords
[No Author keywords available]
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Indexed keywords
HYDROGEN;
MATHEMATICAL MODELS;
SECONDARY ION MASS SPECTROMETRY;
SURFACE PHENOMENA;
HYDROGEN STEMMING;
PRIMARY BEAM CURRENTS;
SIMS ANALYSIS;
SURFACE CONTAMINATION;
CONTAMINATION;
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EID: 35448994718
PISSN: 02679477
EISSN: 13645544
Source Type: Journal
DOI: 10.1039/b705848a Document Type: Article |
Times cited : (22)
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References (19)
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