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Volumn 22, Issue 11, 2007, Pages 1415-1419

A new method to eliminate the influence of in situ contamination in SIMS analysis of hydrogen

Author keywords

[No Author keywords available]

Indexed keywords

HYDROGEN; MATHEMATICAL MODELS; SECONDARY ION MASS SPECTROMETRY; SURFACE PHENOMENA;

EID: 35448994718     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/b705848a     Document Type: Article
Times cited : (22)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.