High-precision oxygen isotope analysis of picogram samples reveals 2 μm gradients and slow diffusion in zircon

American Mineralogist

Volumn 92, Issue 10, 2007, Pages 1772-1775

  Page, F Zeb ^a,c   Ushikubo, T ^a   Kita, N T ^a   Riciputi, L R ^b   Valley, J W ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c OBERLIN COLLEGE   (United States)

Author keywords

Diffusion; Granulites facies; Ion microprobe; Migmatites; Oxygen isotopes; SIMS; Stable isotopes; Zircon

Indexed keywords

DIFFUSION; DIFFUSION IN GASES; ION MICROSCOPES; ISOTOPES; OXYGEN; RECRYSTALLIZATION (METALLURGY); SECONDARY ION MASS SPECTROMETRY; SILICATE MINERALS; ZIRCON;

GRANULITES FACIES; ION MICROPROBE; MIGMATITES; OXYGEN ISOTOPES; STABLE ISOTOPES;

CHEMICAL ANALYSIS;

CHEMICAL ANALYSIS; DIFFUSION; GRANULITE FACIES; ION MICROPROBE; ISOTOPIC ANALYSIS; ISOTOPIC RATIO; METAMORPHISM; MIGMATITE; OXYGEN ISOTOPE; RECRYSTALLIZATION; TEXTURE; ZIRCON;

EID: 35448983583     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2007.2697     Document Type: Article

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