메뉴 건너뛰기




Volumn 46, Issue 22, 2007, Pages 5210-5215

Characterization of scattering in an optical Fabry-Perot resonator

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT TRANSMISSION; OPTICAL DEVICES;

EID: 35448953951     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.005210     Document Type: Article
Times cited : (7)

References (24)
  • 1
    • 84947414997 scopus 로고
    • Cavity quantum electrodynamics
    • S. Haroche and D. Kleppner, "Cavity quantum electrodynamics," Phys. Today 42, 24-30 (1989).
    • (1989) Phys. Today , vol.42 , pp. 24-30
    • Haroche, S.1    Kleppner, D.2
  • 2
    • 0035333541 scopus 로고    scopus 로고
    • Qualification of supermirrors for ring-laser-gyros based on surface roughness and scatter measurements
    • K. D. Skeldon, J. Mackintosh, M. von Gradowski, S. Thieux, and R. Lee, "Qualification of supermirrors for ring-laser-gyros based on surface roughness and scatter measurements," J. Opt. A 3, 183-187 (2001).
    • (2001) J. Opt. A , vol.3 , pp. 183-187
    • Skeldon, K.D.1    Mackintosh, J.2    von Gradowski, M.3    Thieux, S.4    Lee, R.5
  • 3
    • 84893989486 scopus 로고    scopus 로고
    • http://www.ligo.caltech.edu.
  • 4
    • 84893986436 scopus 로고    scopus 로고
    • http://www.cascina.virgo.infn.it.
  • 5
    • 84894007442 scopus 로고    scopus 로고
    • http://tamago.mtk.nao.ac.jp.
  • 6
    • 0035441415 scopus 로고    scopus 로고
    • Characterization of high-finesse mirrors: Loss, phase shifts, and mode structure in an optical cavity
    • C. J. Hood, H. J. Kimble, and J. Ye, "Characterization of high-finesse mirrors: Loss, phase shifts, and mode structure in an optical cavity," Phys. Rev. A 64, 033804 (2001).
    • (2001) Phys. Rev. A , vol.64 , pp. 033804
    • Hood, C.J.1    Kimble, H.J.2    Ye, J.3
  • 10
    • 84975541443 scopus 로고
    • Accurate measurement of the radius of curvature of a concave mirror and the power dependence in a high-finesse Fabry-Perot interferometer
    • N. Uehara and K. Ueda, "Accurate measurement of the radius of curvature of a concave mirror and the power dependence in a high-finesse Fabry-Perot interferometer," Appl. Opt. 34, 5611-5619 (1995).
    • (1995) Appl. Opt , vol.34 , pp. 5611-5619
    • Uehara, N.1    Ueda, K.2
  • 13
    • 84893988242 scopus 로고    scopus 로고
    • We did not observe the scattering rings predicted by Amra et al, 14] for dielectric mirrors. Possible reasons could be that the corrugations at the various interfaces of our multilayer mirror are not perfectly correlated or that the optical penetration depth of the incident field is small enough to shift the scattering rings to large angles and out of view
    • We did not observe the scattering rings predicted by Amra et al. [14] for dielectric mirrors. Possible reasons could be that the corrugations at the various interfaces of our multilayer mirror are not perfectly correlated or that the optical penetration depth of the incident field is small enough to shift the scattering rings to large angles and out of view.
  • 14
    • 0027677835 scopus 로고
    • Comparison of surface and bulk scattering in optical multilayers
    • C. Amra, C. Grèzes-Besset, and L. Bruel, "Comparison of surface and bulk scattering in optical multilayers," Appl. Opt. 32, 5492-5503 (1993).
    • (1993) Appl. Opt , vol.32 , pp. 5492-5503
    • Amra, C.1    Grèzes-Besset, C.2    Bruel, L.3
  • 15
    • 0001501409 scopus 로고
    • Fractal surface finish
    • E. L. Church, "Fractal surface finish," Appl. Opt. 27, 1518-1526 (1988).
    • (1988) Appl. Opt , vol.27 , pp. 1518-1526
    • Church, E.L.1
  • 16
    • 84893987569 scopus 로고    scopus 로고
    • We have also tried to measure the surface roughness with a (WYKO RST-500) interferometer [17, This gave, however, a roughness of only σ, 0.4 nm, which is obviously much smaller compared with the scatter measurement. This discrepancy could originate from various effects. First, the multilayer coating is designed for a wavelength of 532 nm, whereas the WYKO beam profiler works at a wavelength of 633 nm. At this wavelength, the light penetrates the stack of layers much deeper than at 532 nm. Second, the beam profiler illuminates the mirror with a focused beam, whereas in the scatter experiment quasi-plane-wave illumination is used. Third, it is unknown whether the roughness of the consecutive dielectric layers adds up in a coherent or incoherent way. All this makes a comparison of the scattering-deduced surface roughness and the interferometrically deduced value rather difficult
    • We have also tried to measure the surface roughness with a (WYKO RST-500) interferometer [17]. This gave, however, a roughness of only σ = 0.4 nm, which is obviously much smaller compared with the scatter measurement. This discrepancy could originate from various effects. First, the multilayer coating is designed for a wavelength of 532 nm, whereas the WYKO beam profiler works at a wavelength of 633 nm. At this wavelength, the light penetrates the stack of layers much deeper than at 532 nm. Second, the beam profiler illuminates the mirror with a focused beam, whereas in the scatter experiment quasi-plane-wave illumination is used. Third, it is unknown whether the roughness of the consecutive dielectric layers adds up in a coherent or incoherent way. All this makes a comparison of the scattering-deduced surface roughness and the interferometrically deduced value rather difficult.
  • 17
    • 84893997022 scopus 로고    scopus 로고
    • TNO Science and Industry, Business Unit Opto-Mechanical Instrumentation OMI, Delft, The Netherlands
    • TNO Science and Industry, Business Unit Opto-Mechanical Instrumentation (OMI), Delft, The Netherlands.
  • 18
    • 0031420311 scopus 로고    scopus 로고
    • Ring effect studies: Rayleigh scattering, including molecular parameters for rotational Raman scattering, and the Fraunhofer spectrum
    • K. V. Chance and R. J. D. Spurr, "Ring effect studies: Rayleigh scattering, including molecular parameters for rotational Raman scattering, and the Fraunhofer spectrum," Appl. Opt. 36, 5224-5230 (1997).
    • (1997) Appl. Opt , vol.36 , pp. 5224-5230
    • Chance, K.V.1    Spurr, R.J.D.2
  • 19
    • 0021406864 scopus 로고
    • Mirror reflectometer based on optical cavity decay time
    • D. Z. Anderson, J. C. Frisch, and C. S. Masser, "Mirror reflectometer based on optical cavity decay time," Appl. Opt. 23, 1238-1245 (1984).
    • (1984) Appl. Opt , vol.23 , pp. 1238-1245
    • Anderson, D.Z.1    Frisch, J.C.2    Masser, C.S.3
  • 20
    • 29144464162 scopus 로고
    • Cavity ring-down optical spectrometer for absorption measurements using pulsed laser sources
    • A. O'Keefe and D. A. G. Deacon, "Cavity ring-down optical spectrometer for absorption measurements using pulsed laser sources," Rev. Sci. Instrum. 59, 2544-2551 (1988).
    • (1988) Rev. Sci. Instrum , vol.59 , pp. 2544-2551
    • O'Keefe, A.1    Deacon, D.A.G.2
  • 21
    • 0029344251 scopus 로고
    • Accurate measurement of ultralow loss in a high-finesse Fabry-Perot interferometer using the frequency response functions
    • N. Uehara and K. Ueda, "Accurate measurement of ultralow loss in a high-finesse Fabry-Perot interferometer using the frequency response functions," Appl. Phys. B 61, 9-15 (1995).
    • (1995) Appl. Phys. B , vol.61 , pp. 9-15
    • Uehara, N.1    Ueda, K.2
  • 22
    • 84975538355 scopus 로고
    • Measurement of ultralow losses in an optical interferometer
    • G. Rempe, R. J. Thompson, H. J. Kimble, and R. Lalezari, "Measurement of ultralow losses in an optical interferometer," Opt. Lett. 17, 363-365 (1992).
    • (1992) Opt. Lett , vol.17 , pp. 363-365
    • Rempe, G.1    Thompson, R.J.2    Kimble, H.J.3    Lalezari, R.4
  • 23
    • 84894006074 scopus 로고    scopus 로고
    • J. M. Vaughan, Fabry-Perot Interferometer (Adam Hilger, 1989).
    • J. M. Vaughan, Fabry-Perot Interferometer (Adam Hilger, 1989).
  • 24


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.