Ionization in symmetric and nearly symmetric low energy ion-surface collisions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 264, Issue 1, 2007, Pages 23-28

  Chen, X ^a   Sroubek, Z ^a,b   Yarmoff, J A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b INSTITUTE OF PHOTONICS AND ELECTRONICS   (Czech Republic)

Author keywords

Aluminum; Direct recoil; Ion scattering spectroscopy; Ion surface interactions; Low energy ion scattering (LEIS); Low energy ions; Multiply charged ions; Silicon

Indexed keywords

ALUMINUM; ELECTRON DIFFRACTION; IONIZATION; SILICON;

ION SCATTERING SPECTROSCOPY; ION-SURFACE INTERACTIONS; LOW ENERGY IONS; MULTIPLY CHARGED IONS;

ELEMENTARY PARTICLES;

EID: 35448945588     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.08.019     Document Type: Article

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