Aging tests of high power diode lasers as a basis for an international lifetime standard

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2870, Issue , 1996, Pages 381-389

  Dorsch, Friedhelm ^a   Daiminger, Franz X ^a  

^a JEOPTIK Laserdiode GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; DIODES; HIGH POWER LASERS; LASER BEAMS; POWER SEMICONDUCTOR DIODES; TESTING;

ACCELERATED LIFETIME TESTS; CONSTANT OUTPUT POWER; DEGRADATION RATE; HIGH POWER DIODE LASER; INCREASED TEMPERATURE; OPERATING CONDITION; SLOPE EFFICIENCIES; THRESHOLD CURRENTS;

SEMICONDUCTOR LASERS;

EID: 3543146357     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.259922     Document Type: Conference Paper

References (2)

1. e.g. IEC 47C/85/CD: 1994: "Reliability assessment of laser modules"
2. M. Fukuda: "Reliability and Degradation of Semiconductor Lasers and LEDs", Artech House, Inc., Norwood 1991