Physics and materials issues behind the lifetime problem in semiconductor lasers and light emitting diodes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2683, Issue , 1996, Pages 52-58

  Petroff, P M ^a  

^a University of California   (United States)

Author keywords

Characterization and reliability physics; Degradation and lifetime; Vertical surface emitting lasers

Indexed keywords

LIGHT EMITTING DIODES; RELIABILITY; SURFACE EMITTING LASERS;

VERTICAL SURFACE EMITTING LASER;

SEMICONDUCTOR LASERS;

EID: 3543116785     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.237675     Document Type: Conference Paper

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