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Volumn 5366, Issue , 2004, Pages 191-199
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Reflectivity fitting for accurate thickness and compositional determination in RCLEDs
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Author keywords
Least squares fitting; RCLED; Reflectivity; VCSEL
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Indexed keywords
CALIBRATION;
CAVITY RESONATORS;
COMPOSITION;
HETEROJUNCTIONS;
LEAST SQUARES APPROXIMATIONS;
MIRRORS;
MULTILAYERS;
REFLECTION;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING ALUMINUM COMPOUNDS;
TRANSMISSION ELECTRON MICROSCOPY;
WSI CIRCUITS;
COMPLEX MULTILAYER SEMICONDUCTOR HETEROSTRUCTURES;
LEAST SQUARES FITTING;
RECLED;
VCSEL;
LIGHT EMITTING DIODES;
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EID: 3543069311
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.529654 Document Type: Conference Paper |
Times cited : (1)
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References (5)
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