Pyroelectric properties of the b-polyvilnylidene fluoride (PVDF) thin film prepared by vacuum deposition with electric field application

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 11 B, 2002, Pages 7234-7238

  Chang, Dong Hoon ^a   Yoon, Yung Sup ^a  

^a Inha University   (South Korea)

Author keywords

Detectivity; Dynamic method; NEP; Noise; PVDF; Pyroelectric

Indexed keywords

ELECTRIC FIELDS; FLUORIDE MINERALS; POLARIZATION; PYROELECTRICITY; VACUUM APPLICATIONS;

DETECTIVITY; DYNAMIC METHOD; NEP; NOISE; PVDF; PYROELECTRIC;

THIN FILMS;

EID: 3543065586     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.41.7234     Document Type: Article

References (19)

1. S. Hurmila, H. Stubb, J. Pittanen, K. Landenpera and A. Penttinen: Ferroelectrics 115 (1991) 267.
2. H. Kawai: Jpn. J. Appl. Phys. 8 (1969) 975.
3. T. T. Wang and J. E. West: J. Appl. Phys. 53 (1982) 6552.
4. K. T. Chung, B. A. Newman, J. I. Scheinbeim and K. D. Pae: J. Appl. Phys. 53 (1982) 6557.
5. T. Takemura: Ferroelectrics 57 (1984) 243.
6. G. M. Sessler: Electrets (Springer-Verlang, Berlin, 1980) p. 347.
7. B. Ploss, B. Ploss, F. G. Shin, H. L. W. Chan and C. L. Choy: IEEE Trans. Dielectr. & Electr. Insul. 7 (2000) 517.
8. R. Emmerich, S. Bauer and B. Ploss: 7th Int. Symp. Electrets (1991) p. 466.
9. F. Changhui, W. Min and Z. Hongshen: 7th Int. Symp. Electrets (1991) p. 507.
10. D. Stetiadi, T. D. Binnie, A. Armitage, K. Benjanim and H. Weller: Integr. Ferroelectr. 19 (1998) 33.
11. B. Hilczer and J. Kulek: IEEE Trans. Dielectr. & Electr. Insul. 5 (1998) 45.
12. J. Kulek, B. Hilczer and L. Szczepanska: 9th Int. Symp. Electrets (1996) p. 937.
13. L. Capineri, L. Masotti and M. Mazzoni: IEEE Trans. Ultrason., Ferroelectr. & Freq. Control 47 (2000) 1406.
14. V. Samoilov and Y. S. Yoon: IEEE Trans. Ultrason., Ferroelectr., & Freq. Control 45 (1998) 1246.
15. A. Kubono and N. Okui: Polymer Thin Films Prepared by Deposition (Pergamon Publishers, 1994) p. 389.
16. J. C. Vickerman: Surface Analysis-The Principal Techniques (John Wiley & Sons Ltd., England, 1997) p. 268.
17. D. C. Lee, S. H. Park, E. C. Lim and C. S. Choi: Trans. KIEE 45 (1996) 1573 (in Korean).
18. R. Takayama, Y. Tomita, K. Iijima and I. Ueda: J. Appl. Phys. 61 (1987) 411.
19. D. Stetiadi, H. Weller and T. D. Binnie: Sens. & Actual. A 76 (1999) 145.