X-ray diffraction study of mixed-layer compounds in the pseudobinary system SnTe-Bi2Te3

Inorganic Materials

Volumn 39, Issue 3, 2003, Pages 240-246

  Karpinskii, O G ^a   Shelimova, L E ^a   Kretova, M A ^a   Avilov, E S ^a   Zemskov, V S ^a  

^a BAIKOV INSTITUTE OF METALLURGY AND MATERIALS SCIENCE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; TELLURIUM; TIN;

ARTICLE; CHEMICAL COMPOSITION; CRYSTAL STRUCTURE; DECOMPOSITION; POWDER; STRUCTURE ANALYSIS; X RAY DIFFRACTION;

EID: 3543039451     PISSN: 00201685     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1022669323255     Document Type: Article

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