An analytical expression for the characteristic length scale for randomly faulted hexagonal close-packed structures

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 63, Issue 6, 2007, Pages 481-482

  Tiwary, Pratyush ^a   Pandey, Dhananjai ^a  

^a BANARAS HINDU UNIVERSITY   (India)

Author keywords

Characteristic length scale; Hexagonal close packed structures; Random faulting

Indexed keywords

EID: 35349001689     PISSN: 01087673     EISSN: 16005724     Source Type: Journal    
DOI: 10.1107/S0108767307044522     Document Type: Article

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