Extension of single scatter simulation to scatter correction of time-of-flight PET

IEEE Transactions on Nuclear Science

Volumn 54, Issue 5, 2007, Pages 1679-1686

  Watson, Charles C ^a,b  

^a IEEE   (United States)

^b SIEMENS CORPORATE RESEARCH   (United States)

Author keywords

PET; Scatter correction; Single scatter simulation (SSS); Time of flight (TOF)

Indexed keywords

SCATTER CORRECTION; SINGLE SCATTER SIMULATION (SSS); TIME OF FLIGHT (TOF);

IMAGE ANALYSIS; ITERATIVE METHODS; POSITRON EMISSION TOMOGRAPHY; SCATTERING; THREE DIMENSIONAL COMPUTER GRAPHICS;

IMAGING SYSTEMS;

EID: 35348975173     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.901227     Document Type: Article

References (12)

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