Extension of Orientation Mapping to the transmission electron microscope

Materials Science Forum

Volumn 495-497, Issue PART 1, 2005, Pages 225-230

  Dingley, David J ^a  

^a EDAX TSL   (United States)

Author keywords

Dark field crystallography; Orientation mapping; Transmission electron microscopy

Indexed keywords

ALUMINUM; CRYSTALLOGRAPHY; GRAIN SIZE AND SHAPE; PIXELS; TRANSMISSION ELECTRON MICROSCOPY; VECTORS;

DARK FIELD CRYSTALLOGRAPHY; ORIENTATION IMAGING MICROSCOPY TECHNIQUE; ORIENTATION MAPPING; SINGLE GRAINS;

CRYSTAL ORIENTATION;

EID: 35348923494     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-975-x.225     Document Type: Conference Paper

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