Crossed planar X-ray lenses made from nickel for X-ray micro focusing and imaging applications

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 582, Issue 1, 2007, Pages 120-122

  Nazmov, V ^a,b   Reznikova, E ^a   Last, A ^a,b   Mohr, J ^a   Saile, V ^a,b   DiMichiel, M ^c   Gottert J ^d  

^a Foschungszentrum Karlsruhe   (Germany)

^b UNIVERSITY OF KARLSRUHE   (Germany)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d LOUISIANA STATE UNIVERSITY   (United States)

Author keywords

Micro beams; Planar refractive X ray lenses; X ray imaging

Indexed keywords

ATOMIC FORCE MICROSCOPY; FOCUSING; IMAGE PROCESSING; NICKEL; PHOTONS;

MICRO BEAMS; SPOT SIZE; X RAY IMAGING;

LENSES;

EID: 35348921142     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.08.076     Document Type: Article

References (2)

1. J. Susini, D. Joyeux, F. Polack (Eds.) in: Proceedings of the Seventh International Conference on X-ray Microscopy, ESRF, Grenoble, France, 28 July-2 August 2002; J. Phys. IV, 104 (2003).
2. Snigirev A., Snigireva I., DiMichiel M., Honkimaki V., Grigoriev M., Nazmov V., Reznikova E., Mohr J., and Saile V. Proc. SPIE 5539 (2004) 244