Mid-infrared spectromicroscopy beamline at the Canadian Light Source

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 582, Issue 1, 2007, Pages 111-113

  May, Tim ^a   Ellis, Thomas ^a   Reininger, Ruben ^b  

^a CANADIAN LIGHT SOURCE INC   (Canada)

^b Scientific Answers and Solutions   (United States)

Author keywords

Infrared microscopy; Infrared spectromicroscopy; Infrared synchrotron radiation

Indexed keywords

DIFFRACTION; MATERIALS SCIENCE; OPTICAL RESOLVING POWER; PHOTOACOUSTIC SPECTROSCOPY;

BEAMLINE SPANS; CURRENT PERFORMANCE; INFRARED MICROSCOPY; INFRARED SPECTROMICROSCOPY;

LIGHT SOURCES;

EID: 35348920045     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.08.074     Document Type: Article

References (5)

1. May T.E. Infrared Phys. Technol. 45 (2004) 383
2. May T.E., and Bosch R.A. Rev. Sci. Instrum. 73 (2002) 1554
3. Peatman W.B., and Schade U. Rev. Sci. Instrum. 72 (2001) 1620
4. T. E. May, D.A. Appadoo, et al., in: AIP Conference Proceedings 879, Synchrotron Radiation Instrumentation: Ninth International Conference, 2006, p. 579.
5. J.M. Byrd, M.C. Martin, ALS 1999 Activity Report, LBNL-45613, NTIS, U.S. Department of Commerce, USA, 1999, p. 78.