Tuned artificial contrasts to detect signals

International Journal of Production Research

Volumn 45, Issue 23, 2007, Pages 5527-5534

  Hu, J ^a   Runger, G ^a   Tuv, E ^b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

Artificial contrasts; Classification; Multivariate SPC

Indexed keywords

CLASSIFICATION (OF INFORMATION); FAILURE ANALYSIS; GRAPH THEORY; MULTIVARIABLE CONTROL SYSTEMS; STATISTICAL PROCESS CONTROL; SUPERVISED LEARNING;

ARTIFICIAL CONTRASTS; MULTIVARIATE SPC; MULTIVARIATE STATISTICAL PROCESS CONTROL; PROCESS KNOWLEDGE;

SIGNAL DETECTION;

EID: 35348913277     PISSN: 00207543     EISSN: 1366588X     Source Type: Journal    
DOI: 10.1080/00207540701325330     Document Type: Article

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