Salient critical points for meshes

Proceedings - SPM 2007: ACM Symposium on Solid and Physical Modeling

Volumn , Issue , 2007, Pages 277-282

  Liu, Yu Shen ^a   Liu, Min ^a   Kihara, Daisuke ^a   Ramani, Karthik ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

Critical points; Morse theory; Saliency

Indexed keywords

CURVE FITTING; HIERARCHICAL SYSTEMS; TOPOLOGY;

CRITICAL POINTS; GEOMETRIC MEASURE; MESH SALIENCY; MORSE THEORY;

MESH GENERATION;

EID: 35348910163     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1236246.1236285     Document Type: Conference Paper

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