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Volumn 14, Issue 3, 2007, Pages 403-417

The dislocation bias

Author keywords

Diffusion; Dislocations; Point defects; Radiation effects; Void swelling

Indexed keywords

APPROXIMATION THEORY; DIFFUSION; MICROSTRUCTURE; PARAMETER ESTIMATION; POINT DEFECTS; RADIATION EFFECTS;

EID: 35348897843     PISSN: 09281045     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10820-007-9051-3     Document Type: Article
Times cited : (77)

References (30)
  • 11
    • 35348920699 scopus 로고    scopus 로고
    • Kirchner H.O. et al. (ed.) Kiuwer Academic Publ., The Netherlands
    • Bacon, D.J.: In: Kirchner H.O. et al. (ed.), Computer Simulations of Materials, vol. 189. Kiuwer Academic Publ., The Netherlands (1996)
    • (1996) Computer Simulations of Materials , vol.189
    • Bacon, J.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.