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Volumn , Issue , 2007, Pages 74-81

Influence of nanoparticles, Low Melting Point (LMP) fillers, and conducting polymers on electrical, mechanical, and reliability performance of micro-filled conducting adhesives for Z-axis interconnections

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVES; EPOXY RESINS; FILLERS; MELTING POINT; OPTICAL INTERCONNECTS; PARTICLE SIZE;

EID: 35348882067     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2007.373779     Document Type: Conference Paper
Times cited : (19)

References (22)
  • 2
    • 35348842226 scopus 로고    scopus 로고
    • Liu, J., 1999, Conductive Adhesives for Electronics Packaging, (British Isles: Electrochemical Publications Ltd, 1999), pp. 317-320.
    • Liu, J., 1999, Conductive Adhesives for Electronics Packaging, (British Isles: Electrochemical Publications Ltd, 1999), pp. 317-320.
  • 3
    • 33748052034 scopus 로고    scopus 로고
    • Effect of Ag Particle Size on Electrical Conductivity of Isotropically Conductive Adhesives
    • Ye, L., Lai, Z., Liu, J., and Tholen, A., 1999, ''Effect of Ag Particle Size on Electrical Conductivity of Isotropically Conductive Adhesives," IEEE Trans. Electron, Packag., Manuf, Vol. 22, (1999), pp. 299-302.
    • (1999) IEEE Trans. Electron, Packag., Manuf , vol.22 , pp. 299-302
    • Ye, L.1    Lai, Z.2    Liu, J.3    Tholen, A.4
  • 4
    • 2442496810 scopus 로고    scopus 로고
    • Joining Mechanism and Joint Property by Polymer Adhesive with Low Melting Alloy Filler
    • Yasuda, K., Kim, J. M., Rito, M., and Fujimoto, K., "Joining Mechanism and Joint Property by Polymer Adhesive with Low Melting Alloy Filler," Int. Conf. on Electron. Packag., (2003), pp. 149-154.
    • (2003) Int. Conf. on Electron. Packag , pp. 149-154
    • Yasuda, K.1    Kim, J.M.2    Rito, M.3    Fujimoto, K.4
  • 5
    • 18744407157 scopus 로고    scopus 로고
    • New Process of Self-Organized Interconnection in Packaging by Conductive Adhesive with Low Melting Point Filler
    • Yasuda, K., Kim, J. M., Yasuda, M., and Fujimoto, K., "New Process of Self-Organized Interconnection in Packaging by Conductive Adhesive with Low Melting Point Filler," Int. Conf. on Solid State Devices and Materials, (2003), pp. 390-391.
    • (2003) Int. Conf. on Solid State Devices and Materials , pp. 390-391
    • Yasuda, K.1    Kim, J.M.2    Yasuda, M.3    Fujimoto, K.4
  • 7
    • 0040077814 scopus 로고    scopus 로고
    • Interfacial versus Cohesive Failure on Polymer- Metal Interfaces in Electronic Packaging-Effects of Interface Roughness
    • Yao, Q., and Qu, J., 2002, "Interfacial versus Cohesive Failure on Polymer- Metal Interfaces in Electronic Packaging-Effects of Interface Roughness," ASME J. Electron. Packag., Vol. 124 (2002), pp. 127-134.
    • (2002) ASME J. Electron. Packag , vol.124 , pp. 127-134
    • Yao, Q.1    Qu, J.2
  • 8
    • 20344384265 scopus 로고    scopus 로고
    • Thermal and mechanical stability of electrically conductive adhesive joints
    • MAY
    • Xiao J, Chung DDL, "Thermal and mechanical stability of electrically conductive adhesive joints" J. Electronic Mater. 34 (5): 625-629 MAY 2005
    • (2005) J. Electronic Mater , vol.34 , Issue.5 , pp. 625-629
    • Xiao, J.1    Chung, D.D.L.2
  • 9
    • 19544388776 scopus 로고    scopus 로고
    • Effect of solvent evaporation and shrink on conductivity of conductive adhesive
    • MAR
    • Jeong WJ, Nishikawa H, Gotoh H, Takemoto T, "Effect of solvent evaporation and shrink on conductivity of conductive adhesive" Mater. Trans. 46 (3): 704-708 MAR 2005
    • (2005) Mater. Trans , vol.46 , Issue.3 , pp. 704-708
    • Jeong, W.J.1    Nishikawa, H.2    Gotoh, H.3    Takemoto, T.4
  • 10
    • 29044446427 scopus 로고    scopus 로고
    • Electrical characteristics of a new class of conductive adhesive
    • OCT
    • Jeong WJ, Nishikawa H, Itou D, Takemoto T, "Electrical characteristics of a new class of conductive adhesive" Mater. Trans. 46 (10); 2276-2281 OCT 2005
    • (2005) Mater. Trans , vol.46 , Issue.10 , pp. 2276-2281
    • Jeong, W.J.1    Nishikawa, H.2    Itou, D.3    Takemoto, T.4
  • 11
    • 18844422786 scopus 로고    scopus 로고
    • Effect of nano-sized silver particles on the resistivity of polymeric conductiveadhesives
    • OCT
    • Lee HH, Chou KS, Shih ZW, "Effect of nano-sized silver particles on the resistivity of polymeric conductiveadhesives" International J. Adhesion & Adhesives 25 (5): 437-441 OCT 2005
    • (2005) International J. Adhesion & Adhesives , vol.25 , Issue.5 , pp. 437-441
    • Lee, H.H.1    Chou, K.S.2    Shih, Z.W.3
  • 12
    • 33644899073 scopus 로고    scopus 로고
    • The effect of annealing on the morphologies and conductivities of sub-micrometer sized nickel particles used for electrically conductive adhesive
    • MAY 10
    • Goh CF, Yu H, Yong SS, Mhaisalkar SG, Boey FY, Teo PS, "The effect of annealing on the morphologies and conductivities of sub-micrometer sized nickel particles used for electrically conductive adhesive" Thin Solid Films 504 (1-2): 416-420 MAY 10 2006
    • (2006) Thin Solid Films , vol.504 , Issue.1-2 , pp. 416-420
    • Goh, C.F.1    Yu, H.2    Yong, S.S.3    Mhaisalkar, S.G.4    Boey, F.Y.5    Teo, P.S.6
  • 13
    • 33646376478 scopus 로고    scopus 로고
    • Effect of curing conditions on the electrical properties of isotropic conductive adhesives composed of an epoxy-based binder
    • Inoue M, Suganuma K, "Effect of curing conditions on the electrical properties of isotropic conductive adhesives composed of an epoxy-based binder" Soldering & Surfacemount Technology 18 (2): 40-45 2006
    • (2006) Soldering & Surfacemount Technology , vol.18 , Issue.2 , pp. 40-45
    • Inoue, M.1    Suganuma, K.2
  • 14
    • 33745029803 scopus 로고    scopus 로고
    • A study of electrically conductive adhesives as a manufacturing solder alternative
    • MAY
    • Coughlan FM, Lewis HJ, "A study of electrically conductive adhesives as a manufacturing solder alternative" J. Electronic Mater. 35 (5): 912-921 MAY 2006
    • (2006) J. Electronic Mater , vol.35 , Issue.5 , pp. 912-921
    • Coughlan, F.M.1    Lewis, H.J.2
  • 15
    • 0035392379 scopus 로고    scopus 로고
    • Spatial distribution of metal fillers in isotropically conductive adhesives
    • JUL
    • Fu Y, Willander M, Liu J, " Spatial distribution of metal fillers in isotropically conductive adhesives" J. Electronic Mater. 30 (7): 866-871 JUL 2001
    • (2001) J. Electronic Mater , vol.30 , Issue.7 , pp. 866-871
    • Fu, Y.1    Willander, M.2    Liu, J.3
  • 16
    • 0032631656 scopus 로고    scopus 로고
    • Pressure-dependent conduction behavior of various particles for conductive adhesive applications
    • Sancaktar E, Dilsiz N, "Pressure-dependent conduction behavior of various particles for conductive adhesive applications" J. Adhesion Science and Technology 13 (6): 679-693 1999
    • (1999) J. Adhesion Science and Technology , vol.13 , Issue.6 , pp. 679-693
    • Sancaktar, E.1    Dilsiz, N.2
  • 17
    • 28044461540 scopus 로고    scopus 로고
    • Conductivity enhancement of nano silver-filled conductive adhesives by particle surface functionalization
    • NOV
    • Jiang HJ, Moon KS, Lu JX, Wong CP, "Conductivity enhancement of nano silver-filled conductive adhesives by particle surface functionalization" J. Electronic Mater. 34 (11): 1432-1439 NOV 2005
    • (2005) J. Electronic Mater , vol.34 , Issue.11 , pp. 1432-1439
    • Jiang, H.J.1    Moon, K.S.2    Lu, J.X.3    Wong, C.P.4
  • 18
    • 30144443597 scopus 로고    scopus 로고
    • Monolayer-protected silver nano-particle-based anisotropic conductive adhesives: Enhancement of electrical and thermal properties
    • DEC
    • Li Y, Moon KS, Wong CP, "Monolayer-protected silver nano-particle-based anisotropic conductive adhesives: Enhancement of electrical and thermal properties" J. Electronic Mater. 34 (12): 1573-1578 DEC 2005
    • (2005) J. Electronic Mater , vol.34 , Issue.12 , pp. 1573-1578
    • Li, Y.1    Moon, K.S.2    Wong, C.P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.