Test of a MAPS realized in standard non-epitaxial CMOS 0.18 μ m technology

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 581, Issue 1-2 SPEC. ISS., 2007, Pages 335-338

  Servoli, L ^a   Bilei, G M ^a   Passeri, D ^a,b   Placidi, P ^a,b   Biagetti, D ^a,b   Bianchi, T ^a,b   Ciampolini, P ^a,c   Marras, A ^a,c   Delfanti, A ^a,c  

^a INFN SEZIONE DI PERUGIA   (Italy)

^b UNIVERSITY OF PERUGIA   (Italy)

^c UNIVERSITY OF PARMA   (Italy)

Author keywords

MAPS; Non epitaxial; Pixel detectors; X ray detectors

Indexed keywords

MICROSTRUCTURE; OPTIMIZATION; SIGNAL ANALYSIS; SPURIOUS SIGNAL NOISE; X RAYS;

NON-EPITAXIAL; PIXEL DETECTORS; X-RAY DETECTORS;

CMOS INTEGRATED CIRCUITS;

EID: 35348880921     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.07.139     Document Type: Article

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