Robust metric and alignment for profile-based face recognition: An experimental comparison

Proceedings - Seventh IEEE Workshop on Applications of Computer Vision, WACV 2005

Volumn , Issue , 2005, Pages 117-122

  Pan, Gang ^a   Zheng, Lei ^a   Wu, Zhaohui ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DATABASE SYSTEMS; IDENTIFICATION (CONTROL SYSTEMS); MEASUREMENT THEORY; ROBUSTNESS (CONTROL SYSTEMS);

FIDUCIAL POINTS; IMAGE DATABASES;

FACE RECOGNITION;

EID: 35348864358     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ACVMOT.2005.105     Document Type: Conference Paper

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