Characterization and application of a GE amorphous silicon flat panel detector in a synchrotron light source

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 582, Issue 1, 2007, Pages 182-184

  Lee, J H ^a   Almer, J ^a   Aydner, C ^b   Bernier, J ^a   Chapman, K ^a   Chupas, P ^a   Haeffner, D ^a   Kump, K ^c   Lee, P L ^a   Lienert, U ^a   Miceli, A ^a   Vera, G ^c  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c GE HEALTHCARE   (United States)

Author keywords

Flat panel detector; Pair distribution function; Stress strain measurement

Indexed keywords

DEMODULATION; DISTRIBUTION FUNCTIONS; FLAT PANEL DISPLAYS; LIGHT SOURCES; PHOTONS; SYNCHROTRON RADIATION; X RAYS;

FLAT PANEL DETECTOR; PAIR DISTRIBUTION FUNCTION; STRESS-STRAIN MEASUREMENT;

AMORPHOUS SILICON;

EID: 35348853155     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.08.103     Document Type: Article

References (3)

1. J.H. Lee, et al., Argonne National Laboratory, unpublished information, 2007.
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3. Petkov V., Billinger S.J.L., Shastri S.D., and Himmel B. Phys. Rev. Lett. 85 16 (2000) 3436