The laser alignment system for the CMS silicon microstrip tracker

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 581, Issue 1-2 SPEC. ISS., 2007, Pages 351-355

  Wittmer, Bruno ^a   Adolphi, Roman ^a   Henke, Michael ^a   Ostaptchouk, Andrei ^a   Thomas, Maarten ^a   Schael, Stefan ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

Alignment; Silicon detectors; Tracking

Indexed keywords

ALGORITHMS; INFRARED LAMPS; ONLINE SYSTEMS; PARTICLE BEAM TRACKING; SENSORS; SILICON DETECTORS;

INTEGRATED SYSTEM; LASER ALIGNMENT SYSTEM; TRACK RECONSTRUCTION;

SILICON;

EID: 35348842698     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.08.002     Document Type: Article

References (2)

1. A. Behrens, Measurement of the TEC+ in Vertical and Horizontal Position, CERN EDMS Report No. 616538.
2. Martin Weber, I. Physikalisches Institut RWTH Aachen, Germany, private communication.