Dedicated full-field X-ray imaging beamline at Advanced Photon Source

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 582, Issue 1, 2007, Pages 77-79

  Shen, Qun ^a   Lee, Wah Keat ^a   Fezzaa, Kamel ^a   Chu, Yong S ^a   De Carlo, Francesco ^a   Jemian, Peter ^a   Ilavsky, Jan ^a   Erdmann, Mark ^a   Long, Gabrielle G ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Coherent imaging; Phase contrast imaging; X ray microscope

Indexed keywords

DIFFRACTION; MONOCHROMATORS; PHOTONS; SCATTERING PARAMETERS; X RAY ANALYSIS;

COHERENT IMAGING; PHASE CONTRAST IMAGING; SCATTERING IMAGING; X-RAY MICROSCOPY;

IMAGE PROCESSING;

EID: 35348827313     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.08.169     Document Type: Article

References (5)

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