Edge-adaptive demosaicking for artifact suppression along line edges

IEEE Transactions on Consumer Electronics

Volumn 53, Issue 3, 2007, Pages 1076-1083

  Lee, Jonghwa ^b   Jeong, Taeuk ^b   Lee, Chulhee ^a  

^a Yonsei University   (South Korea)

^b NONE

Author keywords

Artifacts along line edges; Demosaicking; Edge adaptive demosaicking; Refinement and calibration

Indexed keywords

IMAGE QUALITY; INTERFERENCE SUPPRESSION; INTERPOLATION; MEAN SQUARE ERROR; PATTERN MATCHING; PIXELS; SIGNAL TO NOISE RATIO;

ARTIFACT SUPPRESSION; EDGE-ADAPTIVE DEMOSAICKING; LINE EDGE;

EDGE DETECTION;

EID: 35348812477     PISSN: 00983063     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCE.2007.4341588     Document Type: Article

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