The solution growth route and characterization of electrochromic tungsten oxide thin films

Materials Research Bulletin

Volumn 42, Issue 12, 2007, Pages 2025-2031

  Todorovski, Toni ^a   Najdoski, Metodija ^a  

^a SS CYRIL AND METHODIUS UNIVERSITY   (Macedonia)

Author keywords

A. Semiconductors; A. Thin films; B. Crystal growth; D. Crystal structure

Indexed keywords

CRYSTAL GROWTH; CRYSTAL STRUCTURE; CYCLIC VOLTAMMETRY; ELECTROCHROMIC DEVICES; ELECTROCHROMISM; OPACITY; SCANNING ELECTRON MICROSCOPY; SODIUM COMPOUNDS; SOLUTIONS; TUNGSTEN COMPOUNDS; X RAY DIFFRACTION;

CYCLIC VOLTAMMOGRAMS; DIMETHYL SULFATE; OPTICAL TRANSMITTANCE SPECTRA; SOLUTION GROWTH ROUTE; TUNGSTEN OXIDE;

THIN FILMS;

EID: 35248873412     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2007.02.004     Document Type: Article

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