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Volumn 6520, Issue PART 3, 2007, Pages
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A solid-state 193 nm laser with high spatial coherence for sub-40 nm interferometric immersion lithography
a b b b b a c
a
Actinix
(United States)
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Author keywords
Immersion lithography; Interferometric lithography; Non linear optics; Photoresist; Ultraviolet lasers
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Indexed keywords
IMMERSION LITHOGRAPHY;
INTERFEROMETRIC LITHOGRAPHY;
NON-LINEAR OPTICS;
ULTRAVIOLET LASERS;
GAUSSIAN BEAMS;
LASER INTERFEROMETRY;
PHOTORESISTS;
SOLID STATE DEVICES;
TRANSMISSION ELECTRON MICROSCOPY;
LITHOGRAPHY;
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EID: 35148897263
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.712210 Document Type: Conference Paper |
Times cited : (12)
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References (7)
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