Atomic number resolution for three spectral CT imaging systems

Progress in Biomedical Optics and Imaging - Proceedings of SPIE

Volumn 6510, Issue PART 1, 2007, Pages

  Tkaczyk, J Eric ^c   Rodrigues, Rogerio ^c   Shaw, Jeffery ^c   Short, Jonathan ^c   Du, Yanfeng ^c   Wu, Xiaoye ^c   Walter, Deborah ^b   Leue, William ^c   Harrison, Daniel ^c   Edic, Peter ^a  

^a GE GLOBAL RESEARCH   (United States)

^b ROSE HULMAN INSTITUTE OF TECHNOLOGY   (United States)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC NUMBER RESOLUTION; BENCHTOP IMAGING SYSTEMS; NOISE STATISTICS; X-RAY ENERGY SPECTRAL INFORMATION;

COMPUTERIZED TOMOGRAPHY; MATHEMATICAL MODELS; PHOSPHORS; PHOTODIODES; X RAY SCATTERING;

IMAGING SYSTEMS;

EID: 35148889231     PISSN: 16057422     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.709905     Document Type: Conference Paper

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