Depth profile of titanium alloy (Ti-6Al-4V) and residual stress measured by using X-ray diffraction after metal cutting assisted by high-pressured jet cooling evaluation of etching methods: ION beam (EDOS) and electro-chemical etching

Materials Science Forum

Volumn 490-491, Issue , 2005, Pages 545-551

  Vosough, Manouchehr ^a,b   Liu, Ping ^c   Svenningsson, Inge ^a,d  

^a LULEÅ UNIVERSITY OF TECHNOLOGY   (Sweden)

^b University of Gävie Sweden   (Sweden)

^c SANDVIK MATERIALS TECHNOLOGY   (Sweden)

^d Sandvik Coromant   (Sweden)

Author keywords

Aerospace material; Residual stress; Titanium (Ti 6Al 4V); Turning; X ray diffraction

Indexed keywords

AEROSPACE INDUSTRY; ELECTROCHEMICAL ETCHING; ION BEAMS; METAL CUTTING; RESIDUAL STRESSES; STRESS MEASUREMENT; THERMAL CONDUCTIVITY; X RAY DIFFRACTION;

CUTTING TOOL; DEPTH PROFILE; HIGH-PRESSURED JET COOLING; WEIGHT RATIO;

TITANIUM ALLOYS;

EID: 35148827621     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/MSF.490-491.545     Document Type: Conference Paper

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