Mutually enhancing test generation and specification inference

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 2931, Issue , 2004, Pages 60-69

  Xie, Tao ^a   Notkin, David ^a  

^a University of Washington   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ITERATIVE METHODS; SPECIFICATIONS;

AUTOMATIC TEST GENERATION; FEED-BACK LOOP; HIGH PROBABILITY; ITERATIVE PROCESS; PROGRAM BEHAVIOR; PROGRAM SPECIFICATION; SPECIFICATION INFERENCES; TEST GENERATIONS;

SOFTWARE TESTING;

EID: 35048857346     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-540-24617-6_5     Document Type: Article

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