|
Volumn 52, Issue 9, 2007, Pages 1130-1136
|
Development of PET and SPECT system using CdTe semiconductor detectors
a a a a
a
HITACHI LTD
(Japan)
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CADMIUM;
TELLURIUM;
ARTICLE;
IMAGING SYSTEM;
POSITRON EMISSION TOMOGRAPHY;
SCINTILLATION;
SEMICONDUCTOR;
SINGLE PHOTON EMISSION COMPUTER TOMOGRAPHY;
|
EID: 34948894597
PISSN: 00099252
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (2)
|
References (7)
|