Bug classification using program slicing metrics

Proceedings - Sixth IEEE International Workshop on Source Code Analysis and Manipulation, SCAM 2006

Volumn , Issue , 2006, Pages 31-40

  Pan, Kai ^a   Kim, Sunghun ^a   Whitehead Jr , E James ^a  

^a University of California Santa Cruz   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; COMPUTER PROGRAMMING LANGUAGES; PROGRAM DEBUGGING;

COHESION PROPERTIES; PROGRAM SLICE INFORMATION; TRADITIONAL CODE METRICS;

CLASSIFICATION (OF INFORMATION);

EID: 34948864447     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SCAM.2006.6     Document Type: Conference Paper

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