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Volumn 106, Issue 3, 2007, Pages 1507-1517

Measuring the relative interface thickness of multilayer polyolefin films with atomic force microscopy

Author keywords

Atomic force microscopy (AFM); Blends; Interfaces; Polyolefins

Indexed keywords

ATOMIC FORCE MICROSCOPY; FILM THICKNESS; INJECTION MOLDING; MULTILAYER FILMS; POLYMER BLENDS; STIFFNESS; TOUGHNESS;

EID: 34948843042     PISSN: 00218995     EISSN: 10974628     Source Type: Journal    
DOI: 10.1002/app.26550     Document Type: Article
Times cited : (10)

References (13)
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    • Kim, J. K.; Sham, M. L.; Wu, J. Compos A 2001, 32, 607.
  • 9
    • 0000837982 scopus 로고    scopus 로고
    • Krishnamoorti, R.; Graessley, W. W.; Dee, G. T.; Walsh, D. J.; Jetters, L. J.; Lohse, D. J. Macromolecules 1996, 29, 367.
    • Krishnamoorti, R.; Graessley, W. W.; Dee, G. T.; Walsh, D. J.; Jetters, L. J.; Lohse, D. J. Macromolecules 1996, 29, 367.
  • 10
    • 0032480726 scopus 로고    scopus 로고
    • Reichart, G. C.; Graessley, W. W.; Register, R. A.; Lohse, D. J. Macromolecules 1998, 31, 7886.
    • Reichart, G. C.; Graessley, W. W.; Register, R. A.; Lohse, D. J. Macromolecules 1998, 31, 7886.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.