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Volumn , Issue , 2006, Pages

3D wafer level packaging approach towards cost effective low loss high density 3D stacking

Author keywords

[No Author keywords available]

Indexed keywords


EID: 34948835594     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICEPT.2006.359749     Document Type: Conference Paper
Times cited : (11)

References (3)
  • 3
    • 34948897267 scopus 로고    scopus 로고
    • Comparison of a Cu UBM versus a Co UBM for Sn flip chip bumps
    • Orlando, FL, USA, May 31, June 3
    • Labie, R., et al., "Comparison of a Cu UBM versus a Co UBM for Sn flip chip bumps", 2005 Electronic Components and Technology conference ECTC '05, Orlando, FL, USA, May 31 - June 3, 2005.
    • (2005) 2005 Electronic Components and Technology conference ECTC '05
    • Labie, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.